Characteristics of NIO Compound Material used in PV Cells, EC Devices, UV Photodetectors, and Gas Sensors
Characterization and Potential Applications of Nickel Oxide Compound Material
by Reetu .*, Dr. Pradeep Kumar,
- Published in Journal of Advances and Scholarly Researches in Allied Education, E-ISSN: 2230-7540
Volume 19, Issue No. 4, Jul 2022, Pages 585 - 590 (6)
Published by: Ignited Minds Journals
ABSTRACT
Nickel oxide (NiO) thin films were developed on soda lime glass using radio-frequency magnetron sputtering at growth (substrate) temperatures ranging from room temperature (RT) to 400 °C. Modifications in structure, morphological, electrical, and optical properties were tracked as the substrate temperature varied. The XRD pattern shows that at 100 °C, the (2 0 0) preferred orientations predominate in the film. Nonetheless, EDX showed that NiO was decomposing all during the development of samples at high temperatures, causing the (2 0 0) peak intensity to gradually decrease. The grains were evenly spread, with a maximum grain size of 19.43 nm, as determined by FESEM examination of the surface morphology. In accordance with the XRD results, we find that raising the growth temperature significantly reduces crystal quality and increases grain size. Maximum scanning probe microscopy (SPM) observed surface roughness (1.232 nm) occurs at room temperature. It was discovered that increasing the substrate temperature greatly decreased the electrical resistivity, from 2150 Ω cm to 72 Ωcm. Transmission tests of light through NiO sheets show that the optical bandgap narrows from 3.8 to 3.2 eV when the substrate is heated. The results raise the possibility that NiO films might be employed in solar energy systems.
KEYWORD
NIO Compound Material, PV Cells, EC Devices, UV Photodetectors, Gas Sensors, Nickel oxide, thin films, soda lime glass, radio-frequency magnetron sputtering, substrate temperature, XRD pattern, EDX, grain size, FESEM examination, surface morphology, crystal quality, scanning probe microscopy, electrical resistivity, optical bandgap, solar energy systems
