Common Techniques Used to Characterize Nano-Crystalline Thin Films

Exploring Characterization Techniques for Nano-Crystalline Thin Films

Abstract

This paper presents some important techniqueslike X-ray diffraction, scanning electron microscopy, energy dispersive analysis of X-ray, optical transmission measurement, which are commonly used to characterized nano-crystalline thin films. Structural parameters like crystallite size, micro-strain, grain size, stoichiometric composition of constituted elements, and optical band gap etc. which are dependent upon these techniques also highlighted briefly.