High Frequency Measurements of Dielectric Behavior of Ceramic Materials Using free Space Method

Characterization and Validation of Dielectric Properties of Ceramic Materials in High Frequency Range

Authors

  • Pradeep Kumar

Keywords:

high frequency, measurements, dielectric behavior, ceramic materials, free space method, microwave, millimeter wave technology, dielectric properties, F band, Performance Network Analyzer, pyramidal horn antennas, quasi-optical bench, TTDS, simulation results, CST-Microwave Studio

Abstract

The dielectric properties measurements of some dielectric materials, used in microwave and millimeter wave technology, are performed in F band (90-140 GHz) by using free space technique. A system, which consist a Performance Network Analyzer, two pyramidal horn antennas, a quasi-optical bench and an in house developed code TTDS are used in measurements. The measurement results are also verified by the simulation results obtained by CST-Microwave Studio

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Published

2018-09-01

How to Cite

[1]
“High Frequency Measurements of Dielectric Behavior of Ceramic Materials Using free Space Method: Characterization and Validation of Dielectric Properties of Ceramic Materials in High Frequency Range”, JASRAE, vol. 15, no. 7, pp. 652–656, Sep. 2018, Accessed: Jul. 17, 2024. [Online]. Available: https://ignited.in/jasrae/article/view/8761

How to Cite

[1]
“High Frequency Measurements of Dielectric Behavior of Ceramic Materials Using free Space Method: Characterization and Validation of Dielectric Properties of Ceramic Materials in High Frequency Range”, JASRAE, vol. 15, no. 7, pp. 652–656, Sep. 2018, Accessed: Jul. 17, 2024. [Online]. Available: https://ignited.in/jasrae/article/view/8761